Advanced Metrology System
NGS 3500
♦ Automated slip line and defect detection
♦ For patterned and Un-patterned wafers
♦ Sophisticated automatic defect detection software
♦ Customized defect detection algorithms available
♦ Suitable for Semiconductor Wafer, MEMS, Hard Disc, Advanced Package
冲成股份有限公司 / JC's Chunson Limited
Tel:+886-2-3234-1279 Fax:+886-3234-7056
Add.:17F., No. 216, Jian 8th Rd., Zhonghe Dist., New Taipei City 235042 , Taiwan