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Advanced Metrology System

NGS 3500

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♦ Automated slip line and defect detection

♦ For patterned and Un-patterned wafers

♦ Sophisticated automatic defect detection software

♦ Customized defect detection algorithms available

♦ Suitable for Semiconductor Wafer, MEMS, Hard Disc, Advanced Package

 冲成股份有限公司 / JC's Chunson Limited         

Tel:+886-2-3234-1279 Fax:+886-3234-7056

Add.:17F., No. 216, Jian 8th Rd., Zhonghe Dist., New Taipei City 235042 , Taiwan