JC's Chunson - Semiconductor -- E+H ( MX6012-DRAT-8C )

Automatic Wafer Geometry Gauge/Sorter ( MX6012-DRAT-8C )

	One or two scans (90°) possible
	1 up to 57 measurement points
	Wafer diameter up to 300 mm
	Dynamic range 300 µm
	Accuracy 0.1 µm, Resolution 10nm
	Resistivity：0.001 - 200 Ohm-cm, Dotation：0.02 – 200 Ohm-cm
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