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200mm Contactless Wafer Gauge for Resistivity, Thickness and P/N ( MX608 )

 

 Max. two radial scans to display wafer Thickness, TTV, Resistivity, and P/N type
 Up to 15 points in one row and optionally an identical scan after 90° rotation
 High throughput:one scan < 10 sec and eight scans  < 20 sec
 Resistivity 0.001 - 200 Ohm-cm, Dotation0.02 – 200 Ohm-cm
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