Solar Wafer Metrology Sorter ( HE-WI-03 )
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High throughput：3,400 wafer / hr |
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Measure mono and multi crystalline wafers of size 125 mm x 125 mm up to 210 mm x 210 mm |
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Measure with high Accuracy: TTV, Cracks, Geometry, Lifetime, Chips |
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The sorting mechanism work acceleration and force |
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This guarantees minimum stress for the wafers |
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