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Name:Semi-Automated Wafer Inspection System

Model:SemDex 301

Type:Layer Thickness Measurement

 

Name:Fully Automatic Wafer Inspection System

Model:SemDex A31/A32

Type:Layer Thickness Measurement

Name:Fully-automated LED Wafer Inspection Metrology Sorting System

Model:SemDex AR13

Type :Layer Thickness Measurement

 冲成股份有限公司 / JC's Chunson Limited         

Tel:+886-2-3234-1279 Fax:+886-3234-7056

Add.:17F., No. 216, Jian 8th Rd., Zhonghe Dist., New Taipei City 235042 , Taiwan