繁體 简体 English
Name:Semi-Automated Wafer Inspection System
Model:SemDex 301
Type:Layer Thickness Measurement
Name:Fully Automatic Wafer Inspection System
Model:SemDex A31/A32
Name:Fully-automated LED Wafer Inspection Metrology Sorting System
Model:SemDex AR13
Type :Layer Thickness Measurement
冲成股份有限公司 / JC's Chunson Limited
Tel:+886-2-3234-1279 Fax:+886-3234-7056
Add.:17F., No. 216, Jian 8th Rd., Zhonghe Dist., New Taipei City 235042 , Taiwan