E+H
OEM integrated thickness and resistivity gauge for 125 mm, 156 mm up to 230 mm solar wafers.
Measurement type
。Thickness
。Flatness (TTV)
。Resistivity
。P/N Dotation
| Wafer Size | 125x125 mm and 156x156 mm and up to 230 mm |
| Accuracy | ±0.5µm |
| Resolution | 0.1µm |
| Thickness range | 100 - 300 µm |
| Software | EHMaster |