E+H
Automatable geometry gauge for thin and standard 200mm or 300mm silicon wafers.
Measurement type
。Thickness
。Flatness (TTV)
。Bow
。Warp
| Wafer Diameter | 200mm, 300mm |
| Accuracy | ±1 µm |
| Resolution | 0.1µm |
| Thickness range | 100 - 750 µm |
| Automatic wafer geometry gauge | yes |
| Software | MXNT |