Name：Semi-Automated Wafer Inspection System
Model：SemDex 301
Type：Layer Thickness Measurement
Name：Fully Automatic Wafer Inspection System
Model：SemDex A31/A32
Type：Layer Thickness Measurement
Name：Fully-automated LED Wafer Inspection Metrology Sorting System
Model：SemDex AR13
Type ：Layer Thickness Measurement
冲成股份有限公司 / JC's Chunson Limited
Tel：+886-2-3234-1279 Fax：+886-3234-7056
Add.：No. 764, Zhong-Zheng Road, Zhong-He, New Taipei City 23586, Taiwan